{"@context":["https://w3id.org/fdo/context/v1",{"schema":"https://schema.org/","prov":"http://www.w3.org/ns/prov#","fdo":"https://w3id.org/fdo/vocabulary/"}],"@id":"https://fdo.portal.mardi4nfdi.de/fdo/Q3589006","@type":"DigitalObject","kernel":{"@id":"https://fdo.portal.mardi4nfdi.de/fdo/Q3589006","digitalObjectType":"https://schema.org/ScholarlyArticle","primaryIdentifier":"mardi:Q3589006","kernelVersion":"v1","immutable":true,"modified":"2026-01-16T13:03:07Z"},"profile":{"@context":"https://schema.org","@type":"ScholarlyArticle","@id":"https://portal.mardi4nfdi.de/entity/Q3589006","name":"Speeding up the simulation of the semiconductor device under microwave interference","headline":"Speeding up the simulation of the semiconductor device under microwave interference","description":"scientific article; zbMATH DE number 5782951","url":"https://portal.mardi4nfdi.de/entity/Q3589006","datePublished":"2010-09-10","author":[{"@id":"https://portal.mardi4nfdi.de/entity/Q285739"},{"@id":"https://portal.mardi4nfdi.de/entity/Q3589005"},{"@id":"https://portal.mardi4nfdi.de/entity/Q1841464"}],"publisher":[{"@id":"https://portal.mardi4nfdi.de/entity/Q2970633"}],"identifier":{"@type":"PropertyValue","propertyID":"doi","value":"10.1108/03321641011028350","url":"https://doi.org/10.1108/03321641011028350"},"sameAs":["https://doi.org/10.1108/03321641011028350"]},"provenance":{"prov:generatedAtTime":"2026-01-16T13:03:07Z","prov:wasAttributedTo":"MaRDI Knowledge Graph"}}